Stalwart

SFT-820

Dual-Compartment FTIR Spectrometer

SFT-820 FTIR spectrometer with two compartments for two channels independent operation, In-situ diffuse reflection and in-situ transmission cell synchronization, no necessary to replace attachments frequently

Configured to room temperature detector and low temperature LN MCT detector sychronization with a max. scan rate 60K

SFT-820 FTIR spectrometer with compact and rigid design to fit to multi-mode measurement of transmission, ATR , diffuse reflection, specular reflection. Dual sample compartment requires no frequent replacement can improve efficiency. It's widely applied to measure solid, liquid, and gas in the third party lab and in-situ characteristics of many categories of catalysts.

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Features
Specifications
Application
Literature

Features

2 channels & 2 sample compartments for independent operation
Easy to auto-switch channels on the software Auto adjust 6 scan speed with 2.5K-3.0K
Software can auto-transfer in K-M format for convenient comparison with diffuse reflection spectra
Save or import background spectra for comparing, reminder valid time function.
Sample compartment is spacious for various bigger IR attachment.
Optical path in good collimated, no necessary to replace large attachments with 2 compartment
ZnSe beam splitter with little maintenance for optional

Specifications

Model	SFT-820
Channels/Compartments	Auto-switch 2 channels, 2 compartments
Spectral range	8000-350cm-1
Spectral resolution	≤1cm-1
Wavenumber precision	≤0.01cm-1
Wavenumber accuracy	≤0.01cm-1
Michelson interferometer	Michelson interferometer with wear free and reliability of 10 year guaranty, with cube-corner mirror resist mechanical and temperature vibration
Beam splitter	ZnSe, KBr
Detector	LN MCT detector / DLATGS detector
IR source	Long life vacuum cooling ceramic light source, 1550K
Laser	Solid laser, 10 years warranty
Software	Win10 software functions including FTIR spectra measure, spectra database pretreatment, spectra comparison, standard peaks finding, user self-build library, quantitative analysis, auto-deduct diamond/CO2 absorption peak, intelligent peak finding warning, one-button test result evaluate, export report and print
Software	Auto switch channels, configured to quick scan speed of 20K, 40K, 60K and diffuse reflectance measure change to K-M spectra

Application

Chemical Reaction Kinetics of Catalysts

Online catalysts at high temperature, high pressure or vacuum catalytic performance
Catalytic reaction mechanics and process
Catalytic surface absorption activities and performances
Catalytic characteristics of Acid/Alkali
New catalysts experiment database
Ingredients identification and structure analysis of catalysts sample

Multi-tasks measurements

Experimenters are always receive various samples for measurement, such as solid, liquid and gas and in order to make a different analysis, say transmission modules, ATR attachments. When it's necessary to replace the different FTIR attachments, SFT-820 can customize immovable attachments, auto-switch optical path at accuracy. Heating in-situ transmission cell

High temperature/pressure in-situ diffuse reflection cell
High temperature/vacuum in-situ diffuse reflection cell
Low temperature/vacuum in-situ diffuse reflection cell
Positive transitivity (paralleled incident light)
Diffuse transmission (integrating sphere attachments)
Reflectivity measure (reflective angle of 10°, 30°, 45°, 80°, and changed degree etc)
ATR measurement (optional crystals: diamond, ZnSe, Ge)
Solid, liquid, gas sample transmission characteristics

Pharm & Life Science

Protein conformation and quantification
Quantification for Active Pharmaceutical Ingredients and excipient in water solution

Microorganism Identification

Characterization for the volatility and stability of medicine combined with TGA module

Polymer and Chemical Products

Detection and Characterization for the volatility and decomposition combined with TGA module
Monitoring reaction process in lab combined with MIR fiber probe module

Surface analysis

Detection and Characterization for the Ultra-Thin film and mono-layer film
Characterization for the erosion process

Material Sciences

Detection of Emissivity of building materials
Evaluation for Optical material such as Infrared windows and mirrors

Semi-conductor Silicon Industry

Different non-metal film measure
Quality control medium carbon / oxygen impurity identification

Soil Analysis

Soil fertility and organic evaluation
Soil properties research

Literature

SFT-820 Brochure

Features
Specifications
Application
Literature